If I remember right the negative sampling width happens only for 498 and at high sampling speeds. It is described in a paper from Stefan:
“Novel Calibration Method for Switched Capacitor Arrays Enables Time Measurements With Sub-Picosecond Resolution”( IEEE Transactions on Nuclear Science 61 (2014),Nr. 6, 3607–3617)
I am using four DRS4 v5 eval boards to digitize 16 channels of data. I have recently changed from saving the timing information of the waveform using GetTime() to GetTimeCalibration(). When changing over, I noticed that some values for fCellDT for cell 498 are negative. Over the 16 channels used, 4 of them have negative time bin widths for cell 498 while the other 12 channels are very close to 0 (in the ~10 ps range). One of the eval boards has no negative fCellDT whereas the other three boards have one or two channels with negative values.
Upon further inspection, I checked the time between samples of GetTime() and found the same results in cell 498. After finding this, I did a timing calibration again with CalibrateTiming() even though in a different post on the discussion forum you said it was valid for a wide range of temperatures and a long time (years). This still allowed the negative fCellDT values to persist.
Is this a common occurance? If so, is there a method to fix this issue? Is there a reason for cell 498 to have a small value for fCellDT? I searched the discussion forum and did not find anything relating to this issue.
Attached are a couple waveform traces using GetTime() zoomed in on cell 498.